INSPECTION METHOD

To provide an inspection method that is a reflection type inspection method and can easily determine whether there are defects on a circular polarizing plate.SOLUTION: An inspection method determines whether there are defects on a film-shaped inspection target 10 that includes a circular polarizing...

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Main Authors MATSUDA SHUNSUKE, KOBAYASHI SHINJI
Format Patent
LanguageEnglish
Japanese
Published 09.08.2023
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Abstract To provide an inspection method that is a reflection type inspection method and can easily determine whether there are defects on a circular polarizing plate.SOLUTION: An inspection method determines whether there are defects on a film-shaped inspection target 10 that includes a circular polarizing plate 1 in which a polarizing film 11 and a retardation film 14 are laminated, and a release film 16a which is laminated on the retardation film 14 side of the circular polarizing plate 1 and formed of a polyethylene terephthalate resin. A light source 4, a band-pass filter 2 which allows light having a predetermined wavelength to pass through, a first polarizing section 3A, an inspection target 10, and a second polarizing section 3B are disposed, and an angle θ of incidence of light onto the inspection target 10 is changed so as to minimize effects of the phase difference of the release film 16a. The method determines whether there are defects on the circular polarizing plate 1 by observing light reflected by the inspection target 10 from the second polarizing section 3B side.SELECTED DRAWING: Figure 1 【課題】反射型の検査方法であって、円偏光板の欠陥の有無を容易に判断することができる検査方法を提供すること。【解決手段】偏光フィルム11と位相差膜14とが積層されてなる円偏光板1、及び、円偏光板1の位相差膜14側に積層されポリエチレンテレフタレート系樹脂からなる剥離フィルム16aを備えるフィルム状の被検査物10の欠陥の有無を判断する検査方法である。光源4と、所定の波長の光を透過させるバンドパスフィルタ2と、第1の偏光部3Aと、被検査物10と、第2の偏光部3Bを配置し、剥離フィルム16aが有する位相差の影響が小さくなるように被検査物10への光の入射角θを変化させる。被検査物10によって反射された光を第2の偏光部3B側から観察して円偏光板1の欠陥の有無を判断する。【選択図】図1
AbstractList To provide an inspection method that is a reflection type inspection method and can easily determine whether there are defects on a circular polarizing plate.SOLUTION: An inspection method determines whether there are defects on a film-shaped inspection target 10 that includes a circular polarizing plate 1 in which a polarizing film 11 and a retardation film 14 are laminated, and a release film 16a which is laminated on the retardation film 14 side of the circular polarizing plate 1 and formed of a polyethylene terephthalate resin. A light source 4, a band-pass filter 2 which allows light having a predetermined wavelength to pass through, a first polarizing section 3A, an inspection target 10, and a second polarizing section 3B are disposed, and an angle θ of incidence of light onto the inspection target 10 is changed so as to minimize effects of the phase difference of the release film 16a. The method determines whether there are defects on the circular polarizing plate 1 by observing light reflected by the inspection target 10 from the second polarizing section 3B side.SELECTED DRAWING: Figure 1 【課題】反射型の検査方法であって、円偏光板の欠陥の有無を容易に判断することができる検査方法を提供すること。【解決手段】偏光フィルム11と位相差膜14とが積層されてなる円偏光板1、及び、円偏光板1の位相差膜14側に積層されポリエチレンテレフタレート系樹脂からなる剥離フィルム16aを備えるフィルム状の被検査物10の欠陥の有無を判断する検査方法である。光源4と、所定の波長の光を透過させるバンドパスフィルタ2と、第1の偏光部3Aと、被検査物10と、第2の偏光部3Bを配置し、剥離フィルム16aが有する位相差の影響が小さくなるように被検査物10への光の入射角θを変化させる。被検査物10によって反射された光を第2の偏光部3B側から観察して円偏光板1の欠陥の有無を判断する。【選択図】図1
Author MATSUDA SHUNSUKE
KOBAYASHI SHINJI
Author_xml – fullname: MATSUDA SHUNSUKE
– fullname: KOBAYASHI SHINJI
BookMark eNrjYmDJy89L5WQQ9PQLDnB1DvH091PwdQ3x8HfhYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpxQWJyal5qSXxXgFGBkbGhoYGxqYGjsZEKQIAIzQf6Q
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
DocumentTitleAlternate 検査方法
ExternalDocumentID JP2023110350A
GroupedDBID EVB
ID FETCH-epo_espacenet_JP2023110350A3
IEDL.DBID EVB
IngestDate Fri Jul 19 12:52:51 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
Japanese
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_JP2023110350A3
Notes Application Number: JP20220011738
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230809&DB=EPODOC&CC=JP&NR=2023110350A
ParticipantIDs epo_espacenet_JP2023110350A
PublicationCentury 2000
PublicationDate 20230809
PublicationDateYYYYMMDD 2023-08-09
PublicationDate_xml – month: 08
  year: 2023
  text: 20230809
  day: 09
PublicationDecade 2020
PublicationYear 2023
RelatedCompanies SUMITOMO CHEMICAL CO LTD
RelatedCompanies_xml – name: SUMITOMO CHEMICAL CO LTD
Score 3.618296
Snippet To provide an inspection method that is a reflection type inspection method and can easily determine whether there are defects on a circular polarizing...
SourceID epo
SourceType Open Access Repository
SubjectTerms INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
Title INSPECTION METHOD
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230809&DB=EPODOC&locale=&CC=JP&NR=2023110350A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwY2BQSTE2NU6zNE7RTUkxSNMF9jcMdBMNkk11jVPMTUGnpxslGoE2OPv6mXmEmnhFmEYwMWTD9sKAzwktBx-OCMxRycD8XgIurwsQg1gu4LWVxfpJmUChfHu3EFsXNWjvGNietjCwVHNxsnUN8Hfxd1Zzdrb1ClDzCwLLAWs6Y1MDR2YGViOQO0BtpzAn0LaUAuQ6xU2QgS0AaFxeiRADU1aiMAOnM-zqNWEGDl_ojLcwAzt4iWZyMVAQmg2LRRgEgV3uAFfw8g8FX9cQD38XUQYlN9cQZw9doC3xcD_FewUguchYjIEF2NlPlWBQMEsySjVPTDFMTgF2jAyTDRNN0gzTgIpSTFOALf9Uc0kGaTwGSeGVlWbgAvHAy9csZRhYSopKU2WBVWpJkhw4KABgzXY6
link.rule.ids 230,309,783,888,25578,76884
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LT4NAEJ7Uqq23ihq1PhpjuBGB7ZZyIMbyCGJ5xKDpjQALiTbRRjD-fYcN1Z563dnMPpLZmW_3m1mAW0YoKXXCJMbkUkK8IUupnFOJMI021dPVVG0SnP1g4r6MvQVddGC5zoXhdUJ_eHFEtKgc7b3m5_Xq_xLL4tzK6i57w6bPeyc2LLFFxxhPT2VdtGaGHYVWaIqmaXiRGDxzGXo6QuWHHdjFGHvaFNq3X2dNWspq06c4A9iLUN1HfQid91SAvrn-ek2Ant--eAuwzymaeYWNrRlWRzBAyB3ZnP4x8u3YDa1juHHs2HQlHCX5W1PiRRszIifQRbBfnMJokqmFljIlZwiMlFxJx6VSYidGGUb-hXYGwy2KzrdKr6Hvxv48mT8GT0M4aCScyqZfQLf--i4u0b3W2RXfll8TF3kq
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=INSPECTION+METHOD&rft.inventor=MATSUDA+SHUNSUKE&rft.inventor=KOBAYASHI+SHINJI&rft.date=2023-08-09&rft.externalDBID=A&rft.externalDocID=JP2023110350A