INSPECTION METHOD

To provide an inspection method that is a reflection type inspection method and can easily determine whether there are defects on a circular polarizing plate.SOLUTION: An inspection method determines whether there are defects on a film-shaped inspection target 10 that includes a circular polarizing...

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Bibliographic Details
Main Authors MATSUDA SHUNSUKE, KOBAYASHI SHINJI
Format Patent
LanguageEnglish
Japanese
Published 09.08.2023
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Summary:To provide an inspection method that is a reflection type inspection method and can easily determine whether there are defects on a circular polarizing plate.SOLUTION: An inspection method determines whether there are defects on a film-shaped inspection target 10 that includes a circular polarizing plate 1 in which a polarizing film 11 and a retardation film 14 are laminated, and a release film 16a which is laminated on the retardation film 14 side of the circular polarizing plate 1 and formed of a polyethylene terephthalate resin. A light source 4, a band-pass filter 2 which allows light having a predetermined wavelength to pass through, a first polarizing section 3A, an inspection target 10, and a second polarizing section 3B are disposed, and an angle θ of incidence of light onto the inspection target 10 is changed so as to minimize effects of the phase difference of the release film 16a. The method determines whether there are defects on the circular polarizing plate 1 by observing light reflected by the inspection target 10 from the second polarizing section 3B side.SELECTED DRAWING: Figure 1 【課題】反射型の検査方法であって、円偏光板の欠陥の有無を容易に判断することができる検査方法を提供すること。【解決手段】偏光フィルム11と位相差膜14とが積層されてなる円偏光板1、及び、円偏光板1の位相差膜14側に積層されポリエチレンテレフタレート系樹脂からなる剥離フィルム16aを備えるフィルム状の被検査物10の欠陥の有無を判断する検査方法である。光源4と、所定の波長の光を透過させるバンドパスフィルタ2と、第1の偏光部3Aと、被検査物10と、第2の偏光部3Bを配置し、剥離フィルム16aが有する位相差の影響が小さくなるように被検査物10への光の入射角θを変化させる。被検査物10によって反射された光を第2の偏光部3B側から観察して円偏光板1の欠陥の有無を判断する。【選択図】図1
Bibliography:Application Number: JP20220011738