INSPECTION DEVICE

To provide a configuration capable of bringing a temperature sensor close to or into contact with the same relative positions relative to respective objects so as to accurately measure temperature of each of the multiple objects.SOLUTION: Adopted is an inspection device 2 including: voltage measurem...

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Bibliographic Details
Main Authors SUZUKI TOMOHARU, NISHIKORI ATSUSHI, INOUE NORIO
Format Patent
LanguageEnglish
Japanese
Published 03.08.2023
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
MEASURING QUANTITY OF HEAT
MEASURING TEMPERATURE
PHYSICS
PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSIONOF CHEMICAL INTO ELECTRICAL ENERGY
TESTING
THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
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Summary:To provide a configuration capable of bringing a temperature sensor close to or into contact with the same relative positions relative to respective objects so as to accurately measure temperature of each of the multiple objects.SOLUTION: Adopted is an inspection device 2 including: voltage measurement pins 624 and current measurement pins 625 as multiple electrodes brought into contact with each of secondary batteries 4 as multiple objects supported by a tray 3 as a support; multiple temperature sensors 64 brought into contact with or brought closer to each of the multiple secondary batteries 4 supported by the tray 3; and a base 61 that supports the multiple voltage measurement pins 624, current measurement pins 625, and the multiple temperature sensors 64, can relatively approach or can be separated from multiple secondary batteries 4 along a predetermined direction, allows each of the multiple voltage measurement pins 624 and the current measurement pins 625 to be individually displaceable relatively along a predetermined direction, and allows each of the multiple temperature sensors 64 to be individually displaceable relatively along a predetermined direction.SELECTED DRAWING: Figure 6 【課題】複数の対象物それぞれの温度を正確に測定すべく、各対象物に対して温度センサをそれぞれ同様の相対位置に近接または当接させることが可能な構成を実現する。【解決手段】支持体たるトレー３に支持させた複数個の対象物たる二次電池４の各々に接触させる複数の電極たる電圧測定用ピン６２４及び電流測定用ピン６２５と、トレー３に支持させた複数個の二次電池４の各々に当接または近接させる複数の温度センサ６４と、複数の電圧測定用ピン６２４、電流測定用ピン６２５及び複数の温度センサ６４を支持し、複数個の二次電池４に対し所定方向に沿って相対的に接近離間でき、前記複数の複数の電圧測定用ピン６２４及び電流測定用ピン６２５の各々が個別にこれに対し所定方向に沿って相対的に変位可能であり、複数の温度センサ６４の各々が個別にこれに対し所定方向に沿って相対的に変位可能である基盤６１とを具備する検査装置２を採用する。【選択図】図６
Bibliography:Application Number: JP20220008700