UNDERFILL MATERIAL AND SEMICONDUCTOR PACKAGE AND MANUFACTURING METHOD THEREFOR
To provide an underfill material capable of suppressing cracking of a hard object in a case where a semiconductor package formed by sealing a semiconductor element with a large size (for example, an element including a semiconductor element with 20 mm square) is arranged to be used at 2000 cycles un...
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Main Authors | , |
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Format | Patent |
Language | English Japanese |
Published |
28.07.2023
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Subjects | |
Online Access | Get full text |
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Summary: | To provide an underfill material capable of suppressing cracking of a hard object in a case where a semiconductor package formed by sealing a semiconductor element with a large size (for example, an element including a semiconductor element with 20 mm square) is arranged to be used at 2000 cycles under an environment of -65°C to 150°C.SOLUTION: The underfill material contains epoxy resin, hardener, inorganic filler and rubber particles.SELECTED DRAWING: None
【課題】サイズの大きい半導体素子(例えば、20mm角の半導体素子を含む)をアンダーフィル材で封止してなる半導体パッケージを、-65℃~150℃の環境下で2000サイクル配置した場合において、硬化物のクラックが抑制されるアンダーフィル材を提供すること。【解決手段】エポキシ樹脂と、硬化剤と、無機充填材と、ゴム粒子と、を含有するアンダーフィル材である。【選択図】なし |
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Bibliography: | Application Number: JP20230088253 |