METHOD FOR ESTIMATING NOISE RESISTANCE PERFORMANCE OF DIFFERENTIAL COMMUNICATION DEVICE, METHOD FOR CREATING ANALYSIS MODEL, AND COLLECTIVE JIG

• Main Authors: KAJITA OSAMU, YONEYAMA TAKESHI, TAKAHASHI MASAKI, MIZOGUCHI MIYUKI, HIRATA YOSHIRO
• Format: Patent
• Language: English; Japanese
• Published: 03.07.2023
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

To enable measurement of Sdc11 at the end of a communication IC even in a complex configuration with a plurality of communication cables connected, and to estimate the noise resistance performance of a differential communication device based on the measured Sdc11.SOLUTION: In an evaluation board 30 on which a communication IC 32 having a communication port of 1 channel is mounted and in which a communication path from the communication port of the communication IC 32 branches from the 1 channel to 2 channels and is connected to a connector 34, a collective jig 10 that converts 2 channels to 1 channel is connected to the connector 34. A network analyzer 50 is connected to a communication path converted to the 1 channel of the collective jig 10 and an S parameter is measured. Sdc11 at the end of the communication IC 32 is measured, whereby the noise resistance performance of the evaluation board 30 is estimated.SELECTED DRAWING: Figure 3 【課題】複数の通信用ケーブルが接続された複雑な形態であっても、通信ＩＣ端部のＳｄｃ１１が測定可能で、測定したＳｄｃ１１に基づいて差動通信装置の耐ノイズ性能を推定する。【解決手段】１ｃｈの通信ポートを有する通信ＩＣ３２が搭載され、通信ＩＣ３２の通信ポートからの通信路が１ｃｈから２ｃｈに分岐してコネクタ３４に接続される評価用基板３０において、コネクタ３４に２ｃｈを１ｃｈに変換する一括治具１０を接続し、一括治具１０の１ｃｈに変換された通信路にネットワークアナライザ５０を接続してＳパラメータの測定を行い、通信ＩＣ３２端部のＳｄｃ１１を測定することで、評価用基板３０の耐ノイズ性能を推定する。【選択図】図３