PROCESS VALUATION DEVICE

• Main Author: NAKAI KENJI
• Format: Patent
• Language: English; Japanese
• Published: 28.06.2023
• Subjects: CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; CONTROL OR REGULATING SYSTEMS IN GENERAL; CONTROLLING; ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS; PHYSICS; PRINTED CIRCUITS; REGULATING

To provide a technique for supporting an analysis of a production step after a termination of the production step.SOLUTION: A process valuation device comprises: a calculation part that calculates an evaluation value for evaluating a specific step of a production step for producing a circuit board by mounting a component to a substrate for each of a plurality of circuit boards; a determination part that determines the quality of the specific step by comparing the evaluation value with a predetermined threshold value for each of the plurality of circuit boards; a storage control part that stores data expressing a difference between the evaluation value and the threshold value for each of the plurality of circuit boards; and an output control part that outputs information using the data to an output device after the production step of the plurality of circuit boards is terminated.SELECTED DRAWING: Figure 2 【課題】生産工程の終了後における生産工程の分析を支援するための技術を提供する。【解決手段】 工程評価装置は、複数個の回路基板のそれぞれについて、部品を基板に実装して当該回路基板を生産する生産工程のうちの特定の工程を評価する評価値を算出する算出部と、前記複数個の回路基板のそれぞれについて、前記評価値と所定の閾値を比較して、前記特定の工程の良否を判断する判断部と、前記複数個の回路基板のそれぞれについて、前記評価値と前記閾値の違いを表すデータをメモリに記憶させる記憶制御部と、前記複数個の回路基板の前記生産工程が終了した後において、前記データを利用した情報を出力装置に出力させる出力制御部と、を備える。【選択図】図２