ARTICLE INSPECTION DEVICE AND ARTICLE INSPECTION METHOD

• Main Authors: TAKADA OSAMU, WAKI SHINYA
• Format: Patent
• Language: English; Japanese
• Published: 27.04.2023
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

To provide article inspection device and method which can reduce a load of setting work of a determination criterion as an inspection parameter for each product class while guaranteeing the required inspection sensitivity.SOLUTION: An article inspection device for inspecting a workpiece W including a plurality of ingredients Wa, Wb, Wc, Wd by using an inspection image of the same comprises: an X-ray image memory 61 which stores information on a prescribed detection value related to an inspection image; a camera 41 which images the workpiece W as a vision sensor; a configuration determination unit 53 which determines the raw material configuration of a content of the workpiece W by executing prescribed recognition processing based on image data of the workpiece W imaged by the camera 41; and a proposal output unit 54 which estimates the detection sensitivity for the prescribed detection value on the basis of storage information of the X-ray image memory 61 and a management sensitivity memory 64 when the configuration determination unit 53 determines the raw material configuration of the content and proposes and outputs the determination criterion of the article inspection.SELECTED DRAWING: Figure 3 【課題】所要の検査感度を担保しながらも、品種ごとの検査パラメータとしての判定基準の設定作業の負担を軽減することができる物品検査装置および方法を提供する。【解決手段】複数の具材Ｗａ、Ｗｂ、Ｗｃ、Ｗｄを含むワークＷをその検査画像を用いて検査する物品検査装置であって、検査画像に係る所定の検出値の情報を記憶するＸ線画像メモリ６１と、視覚センサとしてワークＷを撮像するカメラ４１と、カメラ４１により撮像されたワークＷの画像データを基に所定の認識処理を実行して、ワークＷの内容物の素材構成を判定する構成判定部５３と、構成判定部５３により内容物の素材構成が判定されたとき、Ｘ線画像メモリ６１および管理感度メモリ６４の記憶情報を基に所定の検出値に対する検出感度を推定し、物品検査の判定基準を提案出力する提案出力部５４と、を備える。【選択図】図３