TEST DEVICE

• Main Authors: AOKI YUYA, ISHIHARA SHINJI
• Format: Patent
• Language: English; Japanese
• Published: 13.03.2023
• Subjects: MEASURING; PHYSICS; TESTING; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR

To provide a test device that can accurately predict the behavior of a test piece and use the predicted value to achieve a desired test piece response, that is, to adjust an amount (gain) of displacement and the phase, and to provide a method for adjusting the parameters of the test device.SOLUTION: A test device 100 includes a test piece installation section 9 that places a test piece 10 to be evaluated, an internal sensor that detects the response of an actuator 11, a target waveform setting section 1b that sets an operation pattern of the test device, a user interface 1, and a controller 2 that controls the response of the actuator 11 and presents the test results to the user interface 1. The test device further has a feedback control section 2a that calculates the control input so as to eliminate the difference between the target waveform and the detected value of the internal sensor, a test piece response prediction section 2d which calculates the response of the test piece from the detected value of the internal sensor, and an experimental data analysis section 2c which adjusts at least a test piece response prediction section 2d using the experimental data.SELECTED DRAWING: Figure 2 【課題】供試体の挙動を正確に予測し、その予測値を用いて所望の供試体応答の実現、すなわち、変位の量（ゲイン）と位相の調整を行い得る試験装置及び試験装置のパラメータ調整方法を提供する。【解決手段】試験装置１００は、評価対象である供試体１０を配置する供試体設置部９、アクチュエータ１１の応答を検出する内部センサ、試験装置の動作パターンを設定する目標波形設定部１ｂ、ユーザインタフェース１、アクチュエータ１１の応答を制御し、且つ、試験結果をユーザインタフェース１に提示するコントローラ２と、を備える。目標波形と内部センサの検出値との差を解消するように制御入力を計算するフィードバック制御部２ａ、内部センサの検出値から供試体の応答を計算する供試体応答予測部２ｄ、及び実験データを用いて少なくとも供試体応答予測部２ｄの調整を行う実験データ解析部２ｃを更に有する。【選択図】 図２