NOZZLE INSPECTION METHOD, NOZZLE INSPECTION DEVICE AND SUBSTRATE PROCESSING DEVICE INCLUDING THE SAME
To provide a nozzle inspection method that can accurately detect defect of an inkjet head nozzle within a short time, and to provide a nozzle inspection device.SOLUTION: A nozzle inspection method includes the steps of: discharging a number of droplets within a first interest region of a substrate u...
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Main Authors | , , |
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Format | Patent |
Language | English Japanese |
Published |
08.03.2023
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Subjects | |
Online Access | Get full text |
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Summary: | To provide a nozzle inspection method that can accurately detect defect of an inkjet head nozzle within a short time, and to provide a nozzle inspection device.SOLUTION: A nozzle inspection method includes the steps of: discharging a number of droplets within a first interest region of a substrate using a first nozzle to form an inspection pattern; and determining whether the first nozzle is defective or not on the basis of the inspection pattern.SELECTED DRAWING: Figure 1
【課題】短時間内にインクジェットヘッドノズルの不良を正確に検出できるノズル検査方法およびノズル検査装置が提供されること。【解決手段】前記ノズル検査方法は第1ノズルを用いて基板の第1関心領域内に多数の液滴を吐出し、検査パターンを形成し、前記検査パターンに基づいて、前記第1ノズルが不良か否かを判断する。【選択図】図1 |
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Bibliography: | Application Number: JP20220127625 |