EVALUATION METHOD OF CERAMIC ELECTRONIC COMPONENT

• Main Author: KANEDA KAZUMI
• Format: Patent
• Language: English; Japanese
• Published: 24.02.2023
• Subjects: BASIC ELECTRIC ELEMENTS; CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES ORLIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE; ELECTRICITY

To provide a reliability evaluation method of a ceramic electronic component, capable of accurately evaluating the reliability of a ceramic electronic component.SOLUTION: An evaluation method of a ceramic electronic component includes the steps of: extracting a plurality of ceramic electronic components from a population of ceramic electronic components to perform a high-temperature accelerated limit test on each ceramic electronic component, the ceramic electronic components each comprising a plurality of dielectric layers and a plurality of internal electrode layers stacked therein; identifying an IR deterioration point where leakage current occurs in the dielectric layers, in a plurality of samples that have leakage current exceeding a threshold in the high-temperature accelerated limit test among the plurality of ceramic electronic components; measuring the characteristic value of the IR deterioration point; calculating a voltage acceleration factor n from the characteristic value and an IR deterioration time from the start of the high-temperature accelerated limit test of the plurality of samples to a time when the leakage current exceeds the threshold; and using the voltage acceleration factor n to evaluate the quality of ceramic electronic components of the population.SELECTED DRAWING: Figure 6 【課題】 セラミック電子部品の信頼性を正確に評価することができる、セラミック電子部品の信頼性評価方法を提供する。【解決手段】 セラミック電子部品の評価方法は、複数の誘電体層と複数の内部電極層とが積層されたセラミック電子部品の母集団から、複数のセラミック電子部品を抜き出してそれぞれに対して高温加速寿命試験を行う工程と、前記複数のセラミック電子部品のうち、前記高温加速寿命試験においてリーク電流がしきい値を超えた複数のサンプルにおいて、前記誘電体層中のリーク電流が発生したＩＲ劣化箇所を特定する工程と、前記ＩＲ劣化箇所の特性値を測定する工程と、前記特性値と、前記複数のサンプルの前記高温加速寿命試験の開始から前記リーク電流が前記しきい値を超えるまでのＩＲ劣化時間とから、電圧加速係数ｎを算出する工程と、前記電圧加速係数ｎを用いて前記母集団のセラミック電子部品の品質を評価する工程と、を含む。【選択図】 図６