METHOD FOR EDITING MEASUREMENT SETTING POINT, MEASUREMENT SETTING POINT EDITING DEVICE, AND MEASUREMENT SETTING POINT EDITION PROGRAM

• Main Authors: NAKAMURA KEISUKE, SHIMIZU RYOSUKE, ICHIRIYAMA KAIYO
• Format: Patent
• Language: English; Japanese
• Published: 08.02.2023
• Subjects: GYROSCOPIC INSTRUMENTS; MEASURING; MEASURING DISTANCES, LEVELS OR BEARINGS; NAVIGATION; PHOTOGRAMMETRY OR VIDEOGRAMMETRY; PHYSICS; SURVEYING; TESTING

To provide a method for editing a measurement setting point, a measurement setting point editing device, and a measurement setting point edition program that allow an efficient and proper measurement.SOLUTION: The present invention includes the steps in which: a display unit displays design data including a plurality of first measurement setting points; an input unit receives a selection instruction to select a first measurement setting point in an arbitrary range from the design data and receives an arrangement interval instruction to specify an arrangement interval of a second measurement setting point to add between selected first measurement setting points; and the second measurement setting point is arranged at the arrangement interval specified by the arrangement interval instruction between the first measurement setting points selected by the selection instruction and edition data is prepared.SELECTED DRAWING: Figure 1 【課題】効率良く適切な測設を可能とする測設点編集方法、測設点編集装置及び測設点編集プログラムを提供すること。【解決手段】表示部により、複数の第一測設点を含む設計データを表示させる工程と、入力部により、設計データから任意の範囲の前記第一測設点を選択する選択指示と、選択された前記第一測設点間に追加する第二測設点の配置間隔を指定する配置間隔指示とを受け付ける工程と、選択指示で選択された前記第一測設点間に前記配置間隔指示で指定された前記配置間隔で前記第二測設点を配置して編集データを作成する工程と、を含む。【選択図】図１