NONDESTRUCTIVE INSPECTION SYSTEM AND NONDESTRUCTIVE INSPECTION METHOD

• Main Authors: FUJIMAKI TAKURO, SUGITA TSUKASA, KUME NAOTO, MIYADERA HARUO
• Format: Patent
• Language: English; Japanese
• Published: 20.12.2022
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

To provide a nondestructive inspection technique capable of enhancing both the ability to distinguish types of materials and their resolution.SOLUTION: A nondestructive inspection system 1 includes: an X-ray transmittance analysis unit 15 that analyzes the transmittance of X-ray R based on a difference between the intensity of X-ray R generated by an X-ray generator 4 and the intensity of X-ray R detected by an X-ray detector 5; a material area determination unit 16 that determines a material area 27 that is an area divided for each shape of an object 3 included in a target 2 based on the distribution of the transmittance; a muon passage coordinate analysis unit 17 that analyzes the passage coordinates and the passage angle of muon μ that has passed through each of muon trajectory detectors 6, 7; a muon trajectory data extraction unit 18 that extracts the trajectory of muon μ that has passed through the material area 27 based on the passage coordinates and the passage angle; and a muon scattering analysis unit 19 that analyzes a scattering angle θ of muon scattering that has occurred in the material area 27 based on the trajectory.SELECTED DRAWING: Figure 1 【課題】物質の種類の識別能力と分解能の双方を高めることができる非破壊検査技術を提供する。【解決手段】非破壊検査システム１は、Ｘ線発生装置４で発生させたＸ線Ｒの強度とＸ線検出器５で検出されたＸ線Ｒの強度との差に基づいて、Ｘ線Ｒの透過率を解析するＸ線透過率解析部１５と、透過率の分布に基づいて、対象物２に含まれる物体３の形状毎に分けられる領域である物質領域２７を判定する物質領域判定部１６と、それぞれのミュオン軌跡検出器６，７を通過したミュオンμの通過座標および通過角度を解析するミュオン通過座標解析部１７と、通過座標および通過角度に基づいて、物質領域２７を通過したミュオンμの軌跡を抽出するミュオン軌跡データ抽出部１８と、軌跡に基づいて、物質領域２７で生じたミュオン散乱の散乱角θを解析するミュオン散乱解析部１９を備える。【選択図】図１