SAMPLE SUPPORT

To provide a sample support which enables highly efficient and highly accurate analysis of a sample.SOLUTION: A sample support 1A includes a substrate 2. The substrate 2 has a first surface 2a and a plurality of holes 2c that open in the first surface 2a. The substrate 2 has a first measurement regi...

Full description

Saved in:
Bibliographic Details
Main Authors KOTANI MASAHIRO, OMURA TAKAYUKI
Format Patent
LanguageEnglish
Japanese
Published 15.12.2022
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Online AccessGet full text

Cover

More Information
Summary:To provide a sample support which enables highly efficient and highly accurate analysis of a sample.SOLUTION: A sample support 1A includes a substrate 2. The substrate 2 has a first surface 2a and a plurality of holes 2c that open in the first surface 2a. The substrate 2 has a first measurement region R1 and a second measurement region R2. The first measurement region R1 includes a first surface region 21a of the first surface 2a. The second measurement region R2 includes a second surface region 22a of the first surface 2a. A conductive layer 5 is provided in the first surface region 21a so as not to block the holes 2c. The conductive layer 5 is not provided in the second surface region 22a.SELECTED DRAWING: Figure 1 【課題】試料について高効率かつ高精度な分析を可能とする試料支持体を提供する。【解決手段】試料支持体１Ａは、基板２を備えている。基板２は、第１表面２ａ及び第１表面２ａに開口する複数の孔２ｃを有している。基板２は、第１測定領域Ｒ１と、第２測定領域Ｒ２と、を有している。第１測定領域Ｒ１は、第１表面２ａのうちの第１表面領域２１ａを含んでいる。第２測定領域Ｒ２は、第１表面２ａのうちの第２表面領域２２ａを含んでいる。第１表面領域２１ａには、孔２ｃを塞がないように導電層５が設けられている。第２表面領域２２ａには、導電層５が設けられていない。【選択図】図１
Bibliography:Application Number: JP20210094187