DEVICE AND PROGRAM FOR DETECTING DETERIORATION

• Main Authors: BABA YOSHITAKA, SANO SHINTARO, KAMEI HIROMI, NAKAMURA RISA, KATAYAMA NOBORU
• Format: Patent
• Language: English; Japanese
• Published: 01.12.2022
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

To provide a device and program for detecting deterioration, which allow for discovering occurrence of the PID phenomenon in a solar cell module at an earlier stage.SOLUTION: A deterioration detection device 10 comprises: an acquisition unit 11A configured to acquire an AC circuit model of a solar cell module which enables reproduction of a Nyquist diagram obtained from an AC impedance measurement result of the solar cell module and includes parallel resistors; and a detection unit 11B configured to detect occurrence of a PID phenomenon from a state of decrease in resistance of the parallel resistors in the AC circuit model acquired by the acquisition unit 11A.SELECTED DRAWING: Figure 2 【課題】太陽電池モジュールにおけるＰＩＤ現象の発生を、より早期に発見することができる劣化検出装置及び劣化検出プログラムを得る。【解決手段】劣化検出装置１０は、太陽電池モジュールに対する交流インピーダンスの測定結果から得られるナイキスト線図を再現可能で、かつ、並列抵抗を有する、当該太陽電池モジュールの交流回路モデルを取得する取得部１１Ａと、取得部１１Ａによって取得された交流回路モデルにおける並列抵抗の抵抗値の低下の状況から、ＰＩＤ現象の発生を検出する検出部１１Ｂと、を備える。【選択図】図２