ELECTRONIC CONTROL DEVICE, TESTING DEVICE FOR ELECTRONIC CONTROL DEVICE, AND TESTING METHOD FOR ELECTRONIC CONTROL DEVICE

To provide an electronic control device, a test device, and a test method that reduce a time required to create a test device.SOLUTION: A control program (150) of an electronic control device (1) and a test program (440) of a test device (4) have the same processing layer structure, and request data...

Full description

Saved in:
Bibliographic Details
Main Author ISHIHARA KENTARO
Format Patent
LanguageEnglish
Japanese
Published 26.09.2022
Subjects
Online AccessGet full text

Cover

Loading…