ELECTRONIC CONTROL DEVICE, TESTING DEVICE FOR ELECTRONIC CONTROL DEVICE, AND TESTING METHOD FOR ELECTRONIC CONTROL DEVICE
To provide an electronic control device, a test device, and a test method that reduce a time required to create a test device.SOLUTION: A control program (150) of an electronic control device (1) and a test program (440) of a test device (4) have the same processing layer structure, and request data...
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Main Author | |
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Format | Patent |
Language | English Japanese |
Published |
26.09.2022
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Subjects | |
Online Access | Get full text |
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