ELECTRONIC CONTROL DEVICE, TESTING DEVICE FOR ELECTRONIC CONTROL DEVICE, AND TESTING METHOD FOR ELECTRONIC CONTROL DEVICE

• Main Author: ISHIHARA KENTARO
• Format: Patent
• Language: English; Japanese
• Published: 26.09.2022
• Subjects: ELECTRIC COMMUNICATION TECHNIQUE; ELECTRICITY; TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION

To provide an electronic control device, a test device, and a test method that reduce a time required to create a test device.SOLUTION: A control program (150) of an electronic control device (1) and a test program (440) of a test device (4) have the same processing layer structure, and request data of each processing layer of the control program (150) executed by the electronic control device (1) is created without changing the transmission direction and reception direction of the required communication specifications, and the request data for each processing layer of the test program (440) executed by the test device (4) is created by changing the transmission direction and reception direction of the communication request data, and changing the reception direction to the transmission direction.SELECTED DRAWING: Figure 1 【課題】試験装置の作成時間の短縮を実現する電子制御装置、試験装置、及び試験方法を提供する。【解決手段】電子制御装置（１）の制御プログラム（１５０）と試験装置（４）の試験プログラム（４４０）の処理階層の構成を同様とし、電子制御装置（１）が実行する制御プログラム（１５０）の各処理階層の要求データは、要求される通信仕様の送信方向と受信方向を変更せずに作成し、試験装置（４）が実行する試験プログラム（４４０）の各処理階層の要求データは、通信要求データの送信方向と受信方向に変更し、受信方向を送信方向に変更して作成する。【選択図】図１