THREE-DIMENSIONAL SHAPE MEASURING METHOD AND THREE-DIMENSIONAL SHAPE MEASURING DEVICE
To provide a three-dimensional shape measuring method and a three-dimensional shape measuring device that can measure the three-dimensional shape of an object with high measurement accuracy regardless of the shape of the object.SOLUTION: A three-dimensional shape measuring method includes the steps...
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Main Authors | , |
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Format | Patent |
Language | English Japanese |
Published |
26.09.2022
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Subjects | |
Online Access | Get full text |
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Summary: | To provide a three-dimensional shape measuring method and a three-dimensional shape measuring device that can measure the three-dimensional shape of an object with high measurement accuracy regardless of the shape of the object.SOLUTION: A three-dimensional shape measuring method includes the steps of: projecting a first lattice pattern on an object with first light; picking up an image of the first lattice pattern projected on the object with a camera to obtain a first picked-up image; projecting a second lattice pattern intersecting with the first lattice pattern on the object with second light; picking up an image of the second lattice pattern projected on the object with the camera to obtain a second picked-up image; and performing phase analysis of a lattice image for at least one of the first picked-up image and the second picked-up image to calculate height information on the object.SELECTED DRAWING: Figure 5
【課題】対象物の形状によらず、対象物の三次元形状を高い計測精度で計測可能な三次元形状計測方法および三次元形状計測装置を提供すること。【解決手段】第1の光により、第1格子パターンを対象物に投影するステップと、前記対象物に投影されている前記第1格子パターンをカメラで撮像し、第1撮像画像を得るステップと、第2の光により、前記第1格子パターンと交差する第2格子パターンを前記対象物に投影するステップと、前記対象物に投影されている前記第2格子パターンを前記カメラで撮像し、第2撮像画像を得るステップと、前記第1撮像画像および前記第2撮像画像の少なくとも一方について、格子像の位相解析を行い、前記対象物の高さ情報を算出するステップと、を含むことを特徴とする三次元形状計測方法。【選択図】図5 |
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Bibliography: | Application Number: JP20210038975 |