THREE-DIMENSIONAL MEASUREMENT DEVICE, THREE-DIMENSIONAL MEASUREMENT METHOD, AND THREE-DIMENSIONAL MEASUREMENT PROGRAM

• Main Authors: TOYAMA NOBUTO, MIYAZAKI YUICHI, SATO MASASHI, OYAGI YASUYUKI, UEDA TOMOAKI, INAZUKI YUICHI, YOSHIOKA HIDENORI
• Format: Patent
• Language: English; Japanese
• Published: 16.08.2022
• Subjects: MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

To provide a three-dimensional measurement device, three-dimensional measurement method and three-dimensional measurement program that can properly remove an impact of environment light offset, and to provide a three-dimensional measurement device, three-dimensional measurement method and three-dimensional measurement program that can reduce an impact of a change in environment light offset.SOLUTION: A three-dimensional measurement device 1 comprises: a light reception control unit 31 that acquires data when projecting light, and acquires data when not projecting the light; an approximation computation unit 32 that, as to each of the data when projecting the light and data when not projecting the light generates approximation data when projecting the light and approximation data when not projecting the light approximating a distribution of an amount of received light to a function for each first specific pixel area preliminarily divided and set in a plurality of areas including a plurality of pixels; an environment light component removal computation unit 33 that removes or alleviates a component of environment light from the approximation data when projecting the light, using a computation result by the approximation computation unit 32; and a distance computation unit 34 that generates distance distribution data on a measurement object on the basis of a computation result by the environment light component removal computation unit 33.SELECTED DRAWING: Figure 1 【課題】環境光オフセットの影響を適切に除去できる３次元計測装置、３次元計測方法、３次元計測プログラムを提供する。また、環境光オフセットの変化の影響を低減できる３次元計測装置、３次元計測方法、３次元計測プログラムを提供する。【解決手段】３次元計測装置１は、投光時データの取得を行ない、かつ、非投光時データの取得を行なう受光制御部３１と、投光時データ及び非投光時データのそれぞれについて、複数の画素を含む複数の領域に予め分割設定された第１特定画素領域毎に、受光光量の分布を関数に近似して近似投光時データ及び近似非投光時データを生成する近似演算部３２と、近似演算部３２による演算結果を用いて近似投光時データから環境光の成分を除去又は軽減する環境光成分除去演算部３３と、環境光成分除去演算部３３による演算結果に基づいて測定対象物の距離分布データを生成する距離演算部３４とを備える。【選択図】図１