SURVEYING DEVICE INSPECTION SYSTEM, METHOD FOR INSPECTING SURVEYING DEVICE, AND SURVEYING DEVICE INSPECTING PROGRAM

• Main Authors: NISHI YOSHIHIRO, TANAKA TAKASHI, CHIBA MINORU, MIYAJIMA MOTOHIRO, SATO KOHEI
• Format: Patent
• Language: English; Japanese
• Published: 23.06.2022
• Subjects: GYROSCOPIC INSTRUMENTS; MEASURING; MEASURING DISTANCES, LEVELS OR BEARINGS; NAVIGATION; PHOTOGRAMMETRY OR VIDEOGRAMMETRY; PHYSICS; SURVEYING; TESTING

To allow a user to facilitate the inspection of a surveying device.SOLUTION: The present invention includes: a surveying device 200; a target device 300; a terminal device 100 having an output unit 150; a coordinate measuring unit 121 for measuring a predetermined coordinate; a distance calculating unit 122 for calculating the distance based on the difference of coordinates; an error calculation unit 123 for calculating a measurement error on the basis of the difference of a distance; and an inspection unit 124 for comparing the measurement error calculated by the error calculation unit 123 and a predetermined acceptance error to determine whether the error may be tolerated and outputting the result to the output unit.SELECTED DRAWING: Figure 4 【課題】利用者側で測量装置の点検を容易にすること。【解決手段】測量装置２００と、標的装置３００と、出力部１５０を備えた端末装置１００とを備え、所定の座標を測定する座標測定部１２１と、座標の差に基づく距離を算出する距離算出部１２２と、距離の差に基づいて測定誤差を算出する誤差算出部１２３と、誤差算出部１２３が算出した測定誤差と、予め定められた許容誤差とを比較して、誤差の許容可否を判定し、出力部に出力する点検部１２４、を備える。【選択図】図４