AUTOMATIC INSPECTION SYSTEM AND AUTOMATIC INSPECTION METHOD

• Main Authors: NISHIMURA TAKAMASA, ONO KAZUO
• Format: Patent
• Language: English; Japanese
• Published: 21.06.2022
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC COMMUNICATION TECHNIQUE; ELECTRICITY; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL; PHYSICS; SELECTING; SIGNALLING; TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILARSIGNALS

To provide an automatic inspection system which is operable in a versatile manner, and an automatic inspection method.SOLUTION: An automatic inspection system 1 comprises: an image recognition unit 15 which recognizes an object included in a captured image in a display region of a digital meter 5 and outputs a recognition result; a classifier 16 which selects a classification result corresponding to the recognition result on the basis of correspondence information between the recognition result and a classification result of the recognition result and outputs the classification result as a read result of the digital meter; and a classifier change unit 40 which changes a correspondence between the recognition result and the classification result in the correspondence information or the classifier per se.SELECTED DRAWING: Figure 1 【課題】汎用的な運用が可能な自動点検システム及び自動点検方法を提供する。【解決手段】本発明の一態様の自動点検システム１は、デジタルメータ５の表示領域の撮影画像に含まれるオブジェクトを認識して、認識結果を出力する画像認識部１５と、認識結果と、認識結果の分類結果との対応情報に基づいて、認識結果に対応する分類結果を選択し、分類結果をデジタルメータの読取結果として出力する分類器１６と、対応情報における認識結果と分類結果との対応付け、又は、分類器そのものを変更する分類器変更部４０と、を備える。【選択図】図１