STRUCTURE DETERIORATION PREDICTION DEVICE, STRUCTURE DETERIORATION PREDICTION METHOD, AND STRUCTURE DETERIORATION PREDICTION PROGRAM

• Main Authors: KUDO TETSUO, MAEDA SHINICHI, NASU SEIGO
• Format: Patent
• Language: English; Japanese
• Published: 16.06.2022
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

To facilitate understanding the degree of improvement in the accuracy of structure deterioration prediction.SOLUTION: A deterioration prediction device includes: a deterioration distribution creation unit that creates deterioration distribution of a structure divided into a plurality of surface elements obtained based on n=first inspection of the structure; a first deterioration distribution setting unit that sets first deterioration distribution in consideration of measurement error; a second deterioration distribution setting unit that sets second deterioration distribution in consideration of the measurement error and time error considering the time error; a deterioration speed correction coefficient multiplication unit that can evenly distribute up to 0 multiplication speed by multiplying a deterioration speed correction coefficient so that a degree of deterioration that is most deteriorated can be covered in the second deterioration distribution of an inspection result in consideration of the measurement error and the time error set by the second deterioration distribution setting unit; and a deterioration expression rate correction unit that corrects a deterioration expression rate of deterioration prediction so that the deterioration distribution in consideration of the measurement error and the time error set by the second deterioration distribution setting unit and the second deterioration distribution set by the second deterioration distribution setting unit match.SELECTED DRAWING: Figure 1 【課題】構造物の劣化予測の精度向上の度合いを分かりやすくする。【解決手段】構造物のｎ＝１回目の点検に基づいて得られた、複数の面要素に分割した前記構造物の劣化分布を作成する劣化分布作成部と、測定誤差を考慮した第１の劣化分布を設定する第１の劣化分布設定部と、時間誤差を考慮し、測定誤差、時間誤差を考慮した第２の劣化分布を設定する第２の劣化分布設定部と、第２の劣化分布設定部により設定された、前記測定誤差、時間誤差を考慮した点検結果の第２の劣化分布の中で最も劣化が進んでいる劣化度を網羅できるように劣化速度補正係数を乗じて、０倍速まで均等にばらつかせる劣化速度補正係数乗算部と、前記第２の劣化分布設定部により設定された、前記測定誤差、時間誤差を考慮した劣化分布と、前記第２の劣化分布設定部により設定された第２の劣化分布と、が整合するように、劣化予測の劣化表現率を補正する劣化予測装置。【選択図】図１