LIGHT SOURCE DEVICE AND INSPECTION DEVICE

• Main Authors: ABE TAKASHI, HAYASHI SHINTARO, MOTEGI SHOGO
• Format: Patent
• Language: English; Japanese
• Published: 12.05.2022
• Subjects: BLASTING; FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMSTHEREOF; HEATING; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; LIGHTING; MEASURING; MECHANICAL ENGINEERING; NON-PORTABLE LIGHTING DEVICES; PHYSICS; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHERARTICLES, NOT OTHERWISE PROVIDED FOR; SYSTEMS THEREOF; TESTING; VEHICLE LIGHTING DEVICES SPECIALLY ADAPTED FOR VEHICLEEXTERIORS; WEAPONS

To provide a light source device, etc. that can restrain a deterioration in quality of an object to be inspected, and have high versatility.SOLUTION: A light source device 1 is used for inspection. The light source device 1 comprises a light source 20 for emitting first light L1, and an optical member 30 including a plurality of wavelength conversion bodies for absorbing a portion of the first light L1, and emitting second light L2 having a wavelength different from that of the first light L1. The optical member 30 comprises an incidence surface 30a on which the first light L1 is incident, and an emission surface 30b for emitting emission light L including another portion of the first light L1 incident from the incidence surface 30a and the second light L2. The emission light L has intensity equal to or higher than 5% of peak intensity over a wavelength band of 450 nm or more and 800 nm or less. The emission surface 30b is a light emission surface for the second light L2.SELECTED DRAWING: Figure 1 【課題】検査対象物の品質の劣化を抑制することができ、汎用性が高い光源装置などを提供する。【解決手段】光源装置１は、検査に用いられる光源装置である。光源装置１は、第１の光Ｌ１を発する光源２０と、第１の光Ｌ１の一部を吸収し、第１の光Ｌ１とは波長が異なる第２の光Ｌ２を発する複数の波長変換体を含む光学部材３０と、を備える。光学部材３０は、第１の光Ｌ１が入射する入射面３０ａと、入射面３０ａから入射した第１の光Ｌ１の他の一部と第２の光Ｌ２とを含む出射光Ｌを出射する出射面３０ｂと、を有する。出射光Ｌは、４５０ｎｍ以上８００ｎｍ未満の波長帯域に亘ってピーク強度の５％以上の強度を有する。出射面３０ｂは、第２の光Ｌ２の発光面である。【選択図】図１