MANUFACTURING METHOD AND MANUFACTURING APPARATUS FOR SILICON CARBIDE SINGLE CRYSTAL, AND SILICON CARBIDE SINGLE CRYSTAL INGOT

To provide a manufacturing method and a manufacturing apparatus for silicon carbide single crystal that reduce defects such as penetration dislocation, and a silicon carbide single crystal ingot.SOLUTION: A manufacturing method for silicon carbide single crystal in which a raw material gas is suppli...

Full description

Saved in:
Bibliographic Details
Main Authors TSUCHIDA SHUICHI, HOSHINO NORIHIRO, KAMATA ISAO, OKAMOTO TAKESHI, KANDA TAKAHIRO
Format Patent
LanguageEnglish
Japanese
Published 25.04.2022
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:To provide a manufacturing method and a manufacturing apparatus for silicon carbide single crystal that reduce defects such as penetration dislocation, and a silicon carbide single crystal ingot.SOLUTION: A manufacturing method for silicon carbide single crystal in which a raw material gas is supplied into a reaction vessel 20 where a seed substrate 50 is arranged, and heated to a predetermined temperature comprises: a first process of controlling the temperature in the reaction vessel 20 to a first predetermined temperature to grow silicon carbide single crystal 51 on a surface of the seed substrate 50, and thus achieving pair annihilation or composition of penetration dislocation 55; and a second process of keeping the inside of the reaction vessel 20 at the first predetermined temperature after the first process, and putting a tip of the penetration dislocation close to the surface of the seed substrate 50.SELECTED DRAWING: Figure 2 【課題】貫通転位等の欠陥を減少させた炭化珪素単結晶の製造方法及び製造装置、炭化珪素単結晶インゴットの提供。【解決手段】種基板50が配置された反応容器20内に原料ガスを供給し、所定温度に加熱する炭化珪素単結晶の製造方法において、前記反応容器20内の温度を第1所定温度に制御して前記種基板50の表面に炭化珪素単結晶51を成長させることで、貫通転位55の対消滅、もしくは、貫通転位の合成を行う第1工程と、前記第1工程の後に、前記反応容器20内の温度を第1所定温度の状態に維持し、前記貫通転位の先端を種基板50の表面に近付ける第2工程とを有する。【選択図】図2
Bibliography:Application Number: JP20200172489