SEMICONDUCTOR STORAGE DEVICE

To provide a semiconductor storage device allowing for rapidly setting a select gate line at a desired voltage.SOLUTION: A semiconductor storage device in an embodiment comprises a plurality of memory cells, word lines connected to gates of the plurality of memory cells, bit lines electrically conne...

Full description

Saved in:
Bibliographic Details
Main Authors HASHIMOTO TOSHIFUMI, NAKAGAWA TOMOMI, KATO KOJI
Format Patent
LanguageEnglish
Japanese
Published 30.03.2022
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:To provide a semiconductor storage device allowing for rapidly setting a select gate line at a desired voltage.SOLUTION: A semiconductor storage device in an embodiment comprises a plurality of memory cells, word lines connected to gates of the plurality of memory cells, bit lines electrically connected to one ends of the plurality of memory cells through a plurality of select gate transistors respectively connected to the one ends of the plurality of memory cells, two outer select gate lines respectively connected to gates of two of the select gate transistors at both ends of a block, one or more inner select gate lines connected to gates of one or more of the select gate transistors other than those at both ends of the block, and a voltage generation circuit capable of individually controlling voltage supply to the outer select gate lines and the inner select gate lines when reading data recorded on the plurality of memory cells.SELECTED DRAWING: Figure 10 【課題】選択ゲート線を所望の電圧に高速に設定することができる半導体記憶装置を提供する。【解決手段】 実施形態の半導体記憶装置は、複数のメモリセルと、前記複数のメモリセルのゲートに接続されたワード線と、前記複数のメモリセルの一端にそれぞれ接続された複数の選択ゲートトランジスタを介して前記複数のメモリセルの一端に電気的に接続されたビット線と、ブロックの両端の2つの前記選択ゲートトランジスタのゲートにそれぞれ接続された2つのアウター選択ゲート線と、前記ブロックの両端以外の1つ以上の前記選択ゲートトランジスタのゲートに接続された1つ以上のインナー選択ゲート線と、前記複数のメモリセルに記録されたデータの読み出し時に、前記アウター選択ゲート線とインナー選択ゲート線とに対する電圧供給を個別に制御可能な電圧生成回路と、を具備する。【選択図】図10
Bibliography:Application Number: JP20200156299