SPUTTERING TARGET, MANUFACTURING METHOD THEREFOR, AND METHOD FOR MANUFACTURING MAGNETIC RECORDING MEDIUM

To provide a sputtering target that has a lowered specific resistance and contains silicon nitride (Si3 N4), a manufacturing method therefor, and a method for manufacturing a magnetic recording medium.SOLUTION: Provided is a sputtering target containing Si3 N4, SiC, MgO, and TiCN, and having a speci...

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Bibliographic Details
Main Author IWABUCHI YASUYUKI
Format Patent
LanguageEnglish
Japanese
Published 15.03.2022
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Summary:To provide a sputtering target that has a lowered specific resistance and contains silicon nitride (Si3 N4), a manufacturing method therefor, and a method for manufacturing a magnetic recording medium.SOLUTION: Provided is a sputtering target containing Si3 N4, SiC, MgO, and TiCN, and having a specific resistance of 10 mΩ cm or less.SELECTED DRAWING: None 【課題】比抵抗を低下させた、窒化珪素(Si3N4)を含有するスパッタリングターゲット、その製造方法、及び磁気記録媒体の製造方法の提供。【解決手段】Si3N4、SiC、MgO、及びTiCNを含有し、比抵抗が10mΩ・cm以下であるスパッタリングターゲット。【選択図】なし
Bibliography:Application Number: JP20200148519