FLAW DETECTION TESTING METHOD

• Main Authors: KOBAYASHI YUICHI, KATAYAMA TAKESHI, SHINODA KAORU, ABE MASAMITSU
• Format: Patent
• Language: English; Japanese
• Published: 14.03.2022
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

To provide a flaw detection testing method which can shorten a time until an appropriate flaw detection image is electronically stored.SOLUTION: A flaw detection testing method 1 uses a flaw detection image of an object from an ultrasonic flaw detection device (hereinafter, flaw detection device). T...