SEMICONDUCTOR DEVICE, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND METHOD FOR REUSING SUBSTRATE

To provide a method for manufacturing a semiconductor device capable of suitably separating substrates stuck to each other.SOLUTION: According to an embodiment, a method for manufacturing a semiconductor device includes: forming a first semiconductor layer including an impurity atom of a first conce...

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Bibliographic Details
Main Authors MATSUO MIE, HAYASHI HIDEKAZU
Format Patent
LanguageEnglish
Japanese
Published 04.03.2022
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Summary:To provide a method for manufacturing a semiconductor device capable of suitably separating substrates stuck to each other.SOLUTION: According to an embodiment, a method for manufacturing a semiconductor device includes: forming a first semiconductor layer including an impurity atom of a first concentration on a first substrate; forming a second semiconductor layer including an impurity atom having a second concentration higher than the first concentration on the first semiconductor layer; and forming a porous layer in which at least a part of the second semiconductor layer is made porous. The method further includes: forming a first film including a first device on the porous layer; preparing a second substrate in which a second film including a second device is provided; and sticking the first substrate and the second substrate so as to sandwich the first film and the second film. In addition, the method includes: separating the first substrate and the second substrate so that a first portion of the porous layer remains on the first substrate and a second portion of the porous layer remains on the second substrate.SELECTED DRAWING: Figure 3 【課題】貼り合わされた基板同士を好適に分離することが可能な半導体装置の製造方法を提供する。【解決手段】一の実施形態によれば、半導体装置の製造方法は、第1基板上に、第1濃度の不純物原子を含む第1半導体層を形成し、前記第1半導体層上に、前記第1濃度より高い第2濃度の不純物原子を含む第2半導体層を形成し、前記第2半導体層の少なくとも一部がポーラス化したポーラス層を形成することを含む。前記方法はさらに、前記ポーラス層上に、第1デバイスを含む第1膜を形成し、第2デバイスを含む第2膜が設けられた第2基板を用意し、前記第1基板と前記第2基板とを、前記第1膜および前記第2膜を挟むように貼り合わせることを含む。前記方法はさらに、前記第1基板上に前記ポーラス層の第1部分が残存し、前記第2基板上に前記ポーラス層の第2部分が残存するように、前記第1基板と前記第2基板とを分離することを含む。【選択図】図3
Bibliography:Application Number: JP20200138800