SHORT CIRCUIT INSPECTION METHOD FOR LAMINATE TYPE POWER STORAGE DEVICES

• Main Authors: NAKAJIMA EITO, KAWAOKA HIROKAZU
• Format: Patent
• Language: English; Japanese
• Published: 13.12.2021
• Subjects: BASIC ELECTRIC ELEMENTS; CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES ORLIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE; ELECTRICITY; PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSIONOF CHEMICAL INTO ELECTRICAL ENERGY

To facilitate short circuit inspection of a laminate type power storage device.SOLUTION: An inspection method includes the following processing a) to d): a) applying a first probe 71 to a metal sheet 51 of a first laminate film 41 from above an insulating resin layer 52 of the first laminate film 41; b) applying a second probe 72 to a metal sheet 51 of a second laminate film 42 from above an insulating resin layer 52 of the second laminate film 42; c) measuring the resistance between the first probe 71 and a first current collector tab 22 and the resistance between the first probe 71 and a second current collector tab 23; and d) measuring the resistance between the second probe 72 and the first current collector tab 22 and the resistance between the second probe 72 and the second current collector tab 23.SELECTED DRAWING: Figure 1 【課題】ラミネート型蓄電デバイスの短絡検査の容易化【解決手段】検査工程には、以下の処理ａ〜ｄが含まれている。ａ）第１ラミネートフィルム４１の絶縁樹脂層５２の上から第１ラミネートフィルム４１の金属シート５１に第１プローブ７１を当てるｂ）第２ラミネートフィルム４２の絶縁樹脂層５２の上から第２ラミネートフィルム４２の金属シート５１に第２プローブ７２を当てるｃ）第１プローブ７１と第１集電タブ２２との間の抵抗、および、第１プローブ７１と第２集電タブ２３との間の抵抗を測定するｄ）第２プローブ７２と第１集電タブ２２との間の抵抗、および、第２プローブ７２と第２集電タブ２３との間の抵抗を測定する【選択図】図１