DEVICE, ARTICLE WITH DEVICE, AND MANUFACTURING METHOD

To provide a device, an article with the device, and a manufacturing method that can reduce possibility of breakage of a chip.SOLUTION: A device 1 comprises a base layer 2, a chip 4, and a wiring part 3. The base layer 2 is formed on a predetermined surface 50 of an article 5, and has a housing rece...

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Bibliographic Details
Main Authors OBATA KOJI, NAKA JUNICHI, NAGASAKI SUMIHISA, ARAI HIDEYUKI, HIGUCHI YUICHI
Format Patent
LanguageEnglish
Japanese
Published 07.10.2021
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Summary:To provide a device, an article with the device, and a manufacturing method that can reduce possibility of breakage of a chip.SOLUTION: A device 1 comprises a base layer 2, a chip 4, and a wiring part 3. The base layer 2 is formed on a predetermined surface 50 of an article 5, and has a housing recessed part 21 on an arrangement surface 20 being an opposite side to the predetermined surface 50. The chip 4 has a first surface 41 and a second surface 42 in a thickness direction, and is arranged on a bottom surface 210 by directing the second surface 42 to the bottom surface 210 of the housing recessed part 21 of the base layer 2. The wiring part 3 has a specific portion 33 arranged on the arrangement surface 20, and is electrically connected to the chip 4. A distance H1 from the bottom surface 210 of the housing recessed part 21 to the first surface 41 of the chip 4 is less than or equal to a depth D of the housing recessed part 21.SELECTED DRAWING: Figure 3 【課題】課題は、チップの破損の可能性を低減できる、デバイス、デバイス付き物品、及び、製造方法を提供することである。【解決手段】デバイス1は、下地層2と、チップ4と、配線部3と、を備える。下地層2は、物品5の所定面50に形成され、所定面50とは反対側の配置面20に収容凹部21を有する。チップ4は、厚み方向の第1面41及び第2面42を有し、第2面42を下地層2の収容凹部21の底面210に向けて底面210に配置される。配線部3は、配置面20に配置される特定部位33を有し、チップ4に電気的に接続される。収容凹部21の底面210からチップ4の第1面41までの距離H1は、収容凹部21の深さD以下である。【選択図】図3
Bibliography:Application Number: JP20200059102