TEMPERATURE MEASUREMENT APPARATUS AND TEMPERATURE MEASUREMENT METHOD
To lower measurement lower limit temperature while ensuring accuracy in temperature measurement.SOLUTION: The temperature measurement apparatus comprises: a light receiving part receiving thermal radiation light from a measuring object in a state where an absorber is present on an optical path; a de...
Saved in:
Main Authors | , , |
---|---|
Format | Patent |
Language | English Japanese |
Published |
16.09.2021
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | To lower measurement lower limit temperature while ensuring accuracy in temperature measurement.SOLUTION: The temperature measurement apparatus comprises: a light receiving part receiving thermal radiation light from a measuring object in a state where an absorber is present on an optical path; a detection part measuring spectral radiance of the thermal radiation light via a first optical filter to generate a first brightness signal and measuring the spectral radiance of the thermal radiation light via a second optical filter in which the absorber is set to have the same spectral transmittance as the first optical filter to generate a second brightness signal; and a temperature calculation part calculating a temperature of the measuring object from the first and second brightness signals. Under the conditions that two color ratio of a brightness signal is a predetermined value being approximately one at measurement lower limit temperature and the first and second optical filters have the same spectral transmittance, when a relationship between transmission wavelength width of the first optical filter and an amount of change of the two color ratio is obtained, the transmission wavelength widths and center wavelengths of the first and second optical filters are set based on the condition where an inflection point appears in the relationship between the transmission wavelength width of the first optical filter and the amount of change of the two color ratio.SELECTED DRAWING: Figure 8
【課題】測温の正確性を確保しながら測定下限温度をより低くする。【解決手段】本発明の温度測定装置は、吸収体が光路上に存在し得る状態で測定対象物からの熱放射光を受光する受光部と、熱放射光の分光放射輝度を、第1光学フィルタを介して測定して第1輝度信号を生成するとともに、第1光学フィルタと吸収体の分光透過率が同一となるように設定された第2光学フィルタを介して測定して第2輝度信号を生成する検出部と、第1及び第2輝度信号から測定対象物の温度を算出する温度算出部と、を有し、輝度信号の2色比が測定下限温度で約1となる所定の値であり、第1及び第2光学フィルタの分光透過率が同一であるという条件の下で、第1光学フィルタの透過波長幅と2色比の変化量との関係を得た場合に、第1光学フィルタの透過波長幅と2色比の変化量との関係において変曲点となる条件に基づき、第1及び第2光学フィルタの透過波長幅及び中心波長を設定する。【選択図】図8 |
---|---|
Bibliography: | Application Number: JP20200036690 |