POLISHING HEAD SYSTEM AND POLISHING APPARATUS
To provide a polishing head system capable of precisely controlling a film-thickness profile of a workpiece, such as a wafer, a substrate, or a panel.SOLUTION: A polishing head system includes a polishing head 7 having a plurality of piezoelectric elements 47 configured to apply pressing forces to a...
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Main Authors | , , , , , , , , , |
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Format | Patent |
Language | English Japanese |
Published |
05.08.2021
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Subjects | |
Online Access | Get full text |
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Summary: | To provide a polishing head system capable of precisely controlling a film-thickness profile of a workpiece, such as a wafer, a substrate, or a panel.SOLUTION: A polishing head system includes a polishing head 7 having a plurality of piezoelectric elements 47 configured to apply pressing forces to a workpiece W, and an operation controller 10 configured to determine instruction values of voltages to be applied to the plurality of piezoelectric elements 47.SELECTED DRAWING: Figure 5
【課題】ウェーハ、基板、パネルなどのワークピースの膜厚プロファイルを精密に制御することができる研磨ヘッドシステムを提供する。【解決手段】研磨ヘッドシステムは、複数の押付力をワークピースWに加える複数の圧電素子47を有する研磨ヘッド7と、複数の圧電素子47に印加すべき電圧の複数の指令値を決定する動作制御部10を備えている。【選択図】図5 |
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Bibliography: | Application Number: JP20200006393 |