EVALUATION DEVICE AND METHOD FOR EVALUATION

• Main Authors: GOTO TAKAYUKI, SONE TAKURO
• Format: Patent
• Language: English; Japanese
• Published: 03.06.2021
• Subjects: CALCULATING; COMPUTING; COUNTING; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

To provide an evaluation device that can suppress influence of the shape of a measurement surface and can precisely measure the quality of the surface even when a measurement target object is a three-dimensional object.SOLUTION: The evaluation device includes: an illumination device for applying light to a surface of a measurement target object; an imaging device for acquiring an image of the surface of the measurement target object; and an image evaluation unit for evaluating the quality of the measurement target object by using a predetermined region of the acquired image as an evaluation region. The evaluation region set by the image evaluation unit is set in the inner side of an illumination region of the image, which is a region where the light applied by the illumination device is seen in the surface of the target evaluation object.SELECTED DRAWING: Figure 1 【課題】測定対象物が立体物の場合にも計測面の形状の影響を抑制し、表面品質を精度よく測定可能な評価装置の提供。【解決手段】測定対象物の表面に光を照射するための照明装置と、前記測定対象物の表面の画像を取得するための撮像装置と、取得された画像のうち所定の領域を評価領域として前記測定対象物の品質を評価する画像評価部と、を有し、前記画像評価部が設定する前記評価領域は、前記画像のうち、前記照明装置によって照射される前記光が前記測定対象物の表面に写り込んでいる領域である照明領域の内側に設定されることを特徴とする評価装置。【選択図】図１