STORAGE DEVICE

To provide a storage device capable of measuring performance improvement.SOLUTION: A storage device 10 according to an embodiment includes a first die 100 and a second die 200 which are laminated, the first die includes a plurality of die regions 110 blocked by a dicing region 120, each of the plura...

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Bibliographic Details
Main Author NAKAMURA MASAMI
Format Patent
LanguageEnglish
Japanese
Published 25.03.2021
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
INFORMATION STORAGE
PHYSICS
SEMICONDUCTOR DEVICES
STATIC STORES
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Summary:To provide a storage device capable of measuring performance improvement.SOLUTION: A storage device 10 according to an embodiment includes a first die 100 and a second die 200 which are laminated, the first die includes a plurality of die regions 110 blocked by a dicing region 120, each of the plurality of die regions includes a memory array circuit 111, and the second die includes a write and read circuit part which performs data reading and writing for a plurality of memory cell array circuits included in the first die.SELECTED DRAWING: Figure 1 【課題】 性能の向上をはかることが可能な記憶装置を提供する。【解決手段】 実施形態に係る記憶装置１０は、積層された第１のダイ１００及び第２のダイ２００を備え、第１のダイは、ダイシング領域１２０によって区画された複数のダイ領域１１０を含み、複数のダイ領域のそれぞれはメモリセルアレイ回路１１１を含み、第２のダイは、第１のダイに含まれる複数のメモリセルアレイ回路に対してデータの読み書きを行う書込・読出回路部を含む。【選択図】図１
Bibliography:Application Number: JP20190171095