SEMICONDUCTOR DEVICE

To provide a semiconductor device that can maintain an accurate current monitoring function in a semiconductor device manufactured using a SiC substrate.SOLUTION: A semiconductor device includes a semiconductor substrate including an active region where a main switching element structure is formed,...

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Bibliographic Details
Main Authors YAMASHITA YUSUKE, KATO TAKEHIRO, MISUMI TADASHI, UEHARA JUNICHI
Format Patent
LanguageEnglish
Japanese
Published 01.03.2021
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Summary:To provide a semiconductor device that can maintain an accurate current monitoring function in a semiconductor device manufactured using a SiC substrate.SOLUTION: A semiconductor device includes a semiconductor substrate including an active region where a main switching element structure is formed, a current sense region where the sense switching element structure is formed, and a peripheral region located around the active region and the current sense region. The semiconductor substrate is a 4H-SiC substrate having an off angle in the <11-20> direction. The current sense region is arranged in a range in which the active region does not exist when viewed along the <1-100> direction.SELECTED DRAWING: Figure 1 【課題】SiC基板を用いて製造された半導体装置において、正確な電流監視機能能を維持することができる半導体装置を提供する。【解決手段】半導体装置は、メインスイッチング素子構造が形成されているアクティブ領域と、センススイッチング素子構造が形成されている電流センス領域と、前記アクティブ領域と前記電流センス領域の周囲に位置する周辺領域と、を有する半導体基板、を備えている。前記半導体基板は、<11−20>方向にオフ角を有する4H−SiC基板である。前記電流センス領域は、<1−100>方向に沿って見たときに、前記アクティブ領域が存在しない範囲に配置されている。【選択図】 図1
Bibliography:Application Number: JP20190154890