SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
To provide a semiconductor device capable of suppressing deterioration of reliability be caused by a terminal electrode.SOLUTION: Provided is a semiconductor device 1 including: a semiconductor layer 2 having a first main surface 3 and a roughened second main surface 4; a gate terminal electrode 12...
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Main Authors | , , , |
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Format | Patent |
Language | English Japanese |
Published |
17.12.2020
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Subjects | |
Online Access | Get full text |
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