SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME

To provide a semiconductor device capable of suppressing deterioration of reliability be caused by a terminal electrode.SOLUTION: Provided is a semiconductor device 1 including: a semiconductor layer 2 having a first main surface 3 and a roughened second main surface 4; a gate terminal electrode 12...

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Bibliographic Details
Main Authors ISE KOTA, MIURA YOSHIKATSU, MATSUMOTO YUTAKA, SAITO YASUNORI
Format Patent
LanguageEnglish
Japanese
Published 17.12.2020
Subjects
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