LEARNING PROGRAM, LEARNING METHOD AND LEARNING DEVICE

• Main Authors: ISHIWAKI KENTA, HASHIMA MASAYOSHI, YAMAMOTO TATSUYA, WAKASUGI RYOSUKE
• Format: Patent
• Language: English; Japanese
• Published: 12.11.2020
• Subjects: CONTROL OR REGULATING SYSTEMS IN GENERAL; CONTROLLING; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS; PHYSICS; REGULATING

To reduce deterioration of prediction accuracy.SOLUTION: A quality prediction device calculates a first rate of abnormal values which shows a rate at which abnormal products are manufactured in a testing process testing production of a manufacture. The quality prediction device calculates a second rate of abnormal values which shows a rate at which abnormal products are manufactured on the basis of the manufacture manufactured during prescribed time after starting the manufacture in a mass production process manufacturing the manufacture. The quality prediction device calculates similarities of the testing process and the mass production process on the basis of the first rate of abnormal values and the second rate of abnormal values. The quality prediction device alters the rate which is utilized for learning data causing a learning model to learn among testing data acquired at the testing process based upon the similarity.SELECTED DRAWING: Figure 1 【課題】予測精度の劣化を低減することを課題とする。【解決手段】品質予測装置は、製造物の製造を試験する試験工程において異常な製品が製造された割合を示す第１の異常値割合を算出する。品質予測装置は、製造物を製造する量産工程において製造を開始してから所定時間の間に製造された製造物に基づき、異常な製品が製造された割合を示す第２の異常値割合を算出する。品質予測装置は、第１の異常値割合と第２の異常値割合とに基づき、試験工程と量産工程の類似度を算出する。品質予測装置は、試験工程で得られる試験データのうち、学習モデルに学習させる学習データに利用する割合を、類似度に基づいて変更する。【選択図】図１