X-RAY INSPECTION DEVICE

• Main Author: SUGIMOTO KAZUYUKI
• Format: Patent
• Language: English; Japanese
• Published: 17.09.2020
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING; WEIGHING

To provide an X-ray inspection device capable of accurately estimating the mass of an article including a plurality of components having different characteristics to X-rays.SOLUTION: An X-ray inspection device 1 comprises: an X-ray irradiation part 6 for irradiating an articles G including a plurality of components having different characteristics to X rays with the X rays; an X ray detection part 7 for detecting each X ray of a plurality of energy bands transmitting the article; a formation part 21 for forming an X ray transmission image for each energy band on the basis of the X ray detection result for each energy band; a first estimation part 25 for acquiring first estimates M1 and M2 of the mass of the article G for each energy band on the basis of the X ray transmission image for each energy band; and a second estimation part 28 for acquiring a second estimate M3 of the mass of the article G on the basis of the first estimates M1 and M2 for each energy band.SELECTED DRAWING: Figure 3 【課題】Ｘ線に対する特性の異なる複数の成分を含有する物品の質量を精度良く推定することができるＸ線検出装置を提供する。【解決手段】Ｘ線検査装置１は、Ｘ線に対する特性の異なる複数の成分を含有する物品ＧにＸ線を照射するＸ線照射部６と、物品を透過した複数のエネルギー帯の各々のＸ線を検出するＸ線検出部７と、エネルギー帯毎のＸ線の検出結果に基づいてエネルギー帯毎のＸ線透過画像を生成する生成部２１と、エネルギー帯毎のＸ線透過画像に基づいて、エネルギー帯毎の物品Ｇの質量の第１推定値Ｍ１，Ｍ２を取得する第１推定部２５と、エネルギー帯毎の第１推定値Ｍ１，Ｍ２に基づいて、物品Ｇの質量の第２推定値Ｍ３を取得する第２推定部２８と、を備える。【選択図】図３