MECHANICAL PROPERTY TEST UNIT

To perform a test under a desired low temperature environment including a room temperature to a cryogenic temperature, for a test such as a low strain rate tension test (SSRT test).SOLUTION: There is provided a low strain rate tension test unit 11 for performing test of a test piece 12 under a low t...

Full description

Saved in:
Bibliographic Details
Main Authors IRYO KENICHI, TAKAHAMA YUJI, YOSHINO YUTAKA, HORI YOSHIHIRO, ISHIYAMA HIDEMITSU, HANDA AZUSA
Format Patent
LanguageEnglish
Japanese
Published 31.08.2020
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:To perform a test under a desired low temperature environment including a room temperature to a cryogenic temperature, for a test such as a low strain rate tension test (SSRT test).SOLUTION: There is provided a low strain rate tension test unit 11 for performing test of a test piece 12 under a low temperature environment in a state of storing a test piece peripheral part 15 whose center is the test piece 12, in a test container 16 comprising a refrigerant channel and capable of being controlled in a temperature by the refrigerant, the low strain rate tension test unit has an external heat insulation container 14 having an inner space 14a which is formed into a size so as to store the test container 16 and having heat insulation property. The test container 16 can be suspended and supported, and the external heat insulation container 14 is formed into a cylindrical shape with a bottom and supported in a vertically movable manner by movement means 17. The movement means 17 moves the external heat insulation container 14 for switching a positional relationship between a surrounding position relationship in which the external heat insulation container 14 surrounds the test container 16, and an exposure position relationship in which the external heat insulation container 14 is separated from the test container 16 for exposing the test container 16.SELECTED DRAWING: Figure 1 【課題】低歪速度引張試験(SSRT試験)のような試験について、室温から極低温を含む所望の低温環境下で試験が行えるうえに、高圧環境下でも所望の低温にして試験が行えるようにする。【解決手段】試験片12を中心とした試験片周辺部15を、冷媒体流路を備えて冷媒体による温度制御が可能な試験容器16内に収納して低温環境下で試験片12の試験を行う低歪速度引張試験装置11において、試験容器16を収容可能な大きさの内部空間14aを有し断熱性をもつ外側断熱容器14を設ける。試験容器16は吊り下げ支持するとともに、外側断熱容器14は有底筒状に形成して上下動可能に移動手段17で支持する。移動手段17は、外側断熱容器14を移動させて、外側断熱容器14が試験容器16を囲む包囲位置関係と、外側断熱容器14と試験容器16を離して試験容器16を露出させる露出位置関係とに切り替える。【選択図】図1
Bibliography:Application Number: JP20190024339