SILICA PARTICLE MATERIAL, AND SILICA PARTICLE MATERIAL DISPERSION

• Main Authors: ARAI YUKI, TOMITA NOBUTAKA
• Format: Patent
• Language: English; Japanese
• Published: 27.07.2020
• Subjects: CHEMISTRY; COMPOSITIONS BASED THEREON; COMPOSITIONS OF MACROMOLECULAR COMPOUNDS; COMPOUNDS THEREOF; INORGANIC CHEMISTRY; METALLURGY; NON-METALLIC ELEMENTS; ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; USE OF INORGANIC OR NON-MACROMOLECULAR ORGANIC SUBSTANCES ASCOMPOUNDING INGREDIENTS

To provide a silica particle material dispersion capable of attaining a high filling factor.SOLUTION: The silica particle material dispersion comprises a silica particle material of a median diameter of 150 nm or smaller and a dispersion medium for dispersing the silica particle material, with its I100/half band width in small angle X-ray scattering spectrum being not higher than 300, [I100] represents a peak top of the biggest peak in small angle X-ray scattering spectrum. Small angle X-ray scattering spectrum is measured on the silica particle material dispersion. More concretely, the value of intensity is normalized by defining the total sum of values resulting from multiplying the values (arbitrary unit) of intensity with 0.01, measured by every 0.001° from 0.001° to 1.0° as 100, in small angle X-ray scattering spectrum. The largest value of intensity is denoted as I100, and a half of the intensity value of I100 is denoted as I50. The width of the peak belonging to I100 at the intensity of I50 is defined as the half bandwidth (unit °) of I100.SELECTED DRAWING: None 【課題】高い充填率が実現できるシリカ粒子材料分散液を提供すること。【解決手段】メジアン径が１５０ｎｍ以下のシリカ粒子材料と前記シリカ粒子材料を分散する分散媒とからなり、Ｘ線小角散乱スペクトルのＩ１００／半値幅が３００以下である。ここで、「Ｉ１００」とはＸ線小角散乱スペクトルにおける最も大きなピークのピークトップである。Ｘ線小角散乱スペクトルはシリカ粒子材料分散液について測定したものである。具体的には、Ｘ線小角散乱スペクトルにおいて０．００１°〜１．０°まで、０．００１°刻みで測定された強度の値（任意単位）に０．０１を乗じた値の総和を１００として強度の値を規格化する。強度のうち一番大きな値をＩ１００とし、Ｉ１００の強度値の半分をＩ５０とする。Ｉ１００が属するピークにおけるＩ５０の強度でのピークの幅をＩ１００の半値幅（単位°）と定義する。【選択図】なし