TEST SUPPORT DEVICE, TEST SUPPORT METHOD AND COMPUTER PROGRAM

To provide a test support device, a test support method and a computer program that reduce man-hours for preparing tests of a target system.SOLUTION: A test support device 100 comprises: extraction means 11 which extracts specification items from specifications describing specifications of a target...

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Main Authors TANAKA TATSUHITO, SHAKAGUN GENKI, KAWAMURA RYUICHI, OHATA TAKAHIRO, HIROKAWA HIDETOSHI, KUBOUCHI YASUHARU
Format Patent
LanguageEnglish
Japanese
Published 25.06.2020
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Summary:To provide a test support device, a test support method and a computer program that reduce man-hours for preparing tests of a target system.SOLUTION: A test support device 100 comprises: extraction means 11 which extracts specification items from specifications describing specifications of a target system; a test viewpoint database 15 which includes a plurality of test viewpoints each showing a viewpoint when performing tests of the target system; selection means 12 which selects one or a plurality of test viewpoints matching the specification items from the test viewpoint database; and generation means 13 which generates one or a plurality of test cases from the specification items and the one or the plurality of test viewpoints, and generates one or a plurality of test programs and test data corresponding to the one or the plurality of test cases.SELECTED DRAWING: Figure 1 【課題】対象システムのテストの準備にかかる工数を低減する、テスト支援装置、テスト支援方法及びコンピュータプログラムを提供する。【解決手段】テスト支援装置１００は、対象システムの仕様が記載された仕様書から仕様項目を抽出する抽出手段１１と、対象システムのテストを行う際の観点を夫々示す複数のテスト観点を含むテスト観点データベース１５と、テスト観点データベースから、仕様項目に合致する一又は複数のテスト観点を選択する選択手段１２と、仕様項目と一又は複数のテスト観点とから、一又は複数のテストケースを生成するとともに、一又は複数のテストケースに対応する一又は複数のテストプログラム及びテストデータを生成する生成手段１３とを備える。【選択図】図１
Bibliography:Application Number: JP20180235674