SEMICONDUCTOR FILM-FORMING METHOD AND FILM DEPOSITION APPARATUS

To provide a technique for forming a crystallized semiconductor film controlled in grain size without doping an impurity.SOLUTION: A semiconductor film-forming method according to an embodiment disclosed herein is a method for forming a crystallized semiconductor film having a desired grain size on...

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Bibliographic Details
Main Authors KUMAGAI KEITA, FUJITA KEISUKE, KANEMURA RUI
Format Patent
LanguageEnglish
Japanese
Published 04.06.2020
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Summary:To provide a technique for forming a crystallized semiconductor film controlled in grain size without doping an impurity.SOLUTION: A semiconductor film-forming method according to an embodiment disclosed herein is a method for forming a crystallized semiconductor film having a desired grain size on a substrate. The method comprises the steps of: forming a seed layer on the substrate loaded in a process chamber; evacuating the process chamber in a state in which the substrate with the seed layer formed thereon still remains in the process chamber until the pressure in the process chamber reaches medium vacuum or a lower pressure; forming an amorphous semiconductor film on the seed layer after the evacuation of the process chamber; and crystallizing the amorphous semiconductor film by a thermal treatment.SELECTED DRAWING: Figure 2 【課題】不純物をドープすることなく、グレインサイズが制御された結晶化半導体膜を形成できる技術を提供する。【解決手段】本開示の一態様による半導体膜の形成方法は、基板の上に所望のグレインサイズを有する結晶化された半導体膜を形成する方法であって、処理容器内に収容された前記基板の上にシード層を形成する工程と、前記シード層が形成された前記基板を収容した状態で前記処理容器内の圧力を中真空以下に真空引きする工程と、前記処理容器内を真空引きした後、前記シード層の上にアモルファス半導体膜を形成する工程と、前記アモルファス半導体膜を熱処理により結晶化させる工程と、を有する。【選択図】図2
Bibliography:Application Number: JP20180220608