MANUFACTURING CONDITION SPECIFICATION SYSTEM AND METHOD

• Main Authors: HORIWAKI KAZUKI, IMAZAWA KEI
• Format: Patent
• Language: English; Japanese
• Published: 04.06.2020
• Subjects: CALCULATING; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS; COMPUTING; CONTROL OR REGULATING SYSTEMS IN GENERAL; CONTROLLING; COUNTING; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS; PHYSICS; REGULATING

To provide a technique capable of specifying a preferable manufacturing condition even when a manufacturing state varies, and sustaining or upgrading product quality.SOLUTION: A computer of a manufacturing condition specification system uses manufacturing condition data and quality data obtained from a manufacturing flow at each of plural times to construct a model concerning each of the manufacturing condition and product quality for each change in a manufacturing state on each of manufacturing processes of the manufacturing flow (S2). The computer uses the models and a quality target value to calculate as first data for each model a predictive value of manufacturing condition data for the next time through learning (S4). The computer uses the models, manufacturing condition data for the current time, and quality data to predict quality data for the next time and calculates a quality error (S5). The computer uses the first data and quality error to specify the manufacturing condition data for the next time through learning (S8).SELECTED DRAWING: Figure 3 【課題】製造状態の変化がある場合にも、好適な製造条件を特定でき、製品品質を維持または向上できる技術を提供する。【解決手段】製造条件特定システムの計算機は、製造フローからの複数の時点の製造条件データおよび品質データを用いて、製造フローの各製造工程の製造状態の変化毎に、製造条件および品質に関するモデルの各モデルを構築する（Ｓ２）。計算機は、モデルおよび品質目標値を用いて、学習に基づいて、各モデルで、次時点の製造条件データの予測値を第１データとして計算する（Ｓ４）。計算機は、モデルならびに現時点の製造条件データおよび品質データを用いて、次時点の品質データを予測し、品質誤差を計算する（Ｓ５）。計算機は、第１データおよび品質誤差を用いて、学習に基づいて、次時点の製造条件データを特定する（Ｓ８）。【選択図】図３