MEASUREMENT METHOD AND MEASUREMENT SYSTEM FOR FINISHED SHAPE OF STRUCTURE

To provide a method for measuring a finished shape of a structure capable of applying even to a structure having a complicated surface shape.SOLUTION: Dimensions of a structure are measured by scanning a surface of the structure including a surface to be measured to acquire a point cloud on the surf...

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Bibliographic Details
Main Authors FUJIOKA TAISUKE, UCHIBORI HIROYUKI, TAKAOKA REI
Format Patent
LanguageEnglish
Japanese
Published 13.02.2020
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Summary:To provide a method for measuring a finished shape of a structure capable of applying even to a structure having a complicated surface shape.SOLUTION: Dimensions of a structure are measured by scanning a surface of the structure including a surface to be measured to acquire a point cloud on the surface, extracting a contour line C of the surface to be measured from the point cloud and fitting a pattern plate P that approximates the contour line C to the contour line C, based on the fitted pattern plate PF.SELECTED DRAWING: Figure 9 【課題】表面形状が複雑な構造物に対しても適用できる構造物の出来形計測方法を提供する。【解決手段】計測対象面を含む構造物の表面を走査して表面の点群を取得し、点群から計測対象面の輪郭線Cを抽出し、輪郭線Cに近似したパターンプレートPを輪郭線Cにフィッティングし、フィッティングされたパターンプレートPFに基づき構造物の寸法を計測する。【選択図】図9
Bibliography:Application Number: JP20180147374