CONTACTLESS MEASURING SYSTEM

• Main Authors: KAJI RYOSAKU, IWATA SHIRO, HORII YOSHINORI, IMAWAKA NAOTO, NOMURA KENICHI, USHIJIMA YOJI
• Format: Patent
• Language: English; Japanese
• Published: 23.01.2020
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

To provide a contactless measuring system which can make a highly sensitive and highly accurate measurement by setting an appropriate measurement frequency according to the purpose of a measurement and an observation parameter of a measurement target object.SOLUTION: The contactless measuring system includes: a container 300 for a measurement target object containing a measurement target object; a capacitance type sensor 100 arranged not to be in contact with the measurement target object and also to be in contact with or not to be contact with the container for a measurement target object; and a measuring device 200 connected to the capacitance type sensor, the measuring device measuring a capacitance value by applying an AC voltage to the capacitance type sensor at a predetermined measuring frequency. The contactless measuring system sets the measurement frequency according to the region of the value of the observation parameter of the measurement target object.SELECTED DRAWING: Figure 3 【課題】測定の目的、測定対象物の観測パラメータに応じた適切な測定周波数を設定することにより高感度および高精度な測定が可能な非接触測定システムを提供する。【解決手段】測定対象物を収容した被測定物用容器３００と、前記測定対象物とは接触せずに前記被測定物容器の近傍に接触状態または非接触状態で配置された静電容量型センサ１００と、静電容量型センサと接続され、前記静電容量型センサに所定の測定周波数で交流電圧を印加することにより静電容量値を測定する測定装置２００とを備えた非接触測定システムであって、前記測定対象物の観測パラメータの値の領域に応じて前記測定周波数を設定する。【選択図】図３