WIRING BOARD, MANUFACTURING METHOD THEREOF, AND MANUFACTURING METHOD OF SEMICONDUCTOR PACKAGE
To provide a wiring board that can suppress warpage when a semiconductor chip is mounted, a manufacturing method thereof, and a manufacturing method of a semiconductor package.SOLUTION: A wiring board 1 has a first surface 200A and a second surface 200B and includes a wiring member 200 having a plur...
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Main Authors | , |
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Format | Patent |
Language | English Japanese |
Published |
12.12.2019
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Subjects | |
Online Access | Get full text |
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Summary: | To provide a wiring board that can suppress warpage when a semiconductor chip is mounted, a manufacturing method thereof, and a manufacturing method of a semiconductor package.SOLUTION: A wiring board 1 has a first surface 200A and a second surface 200B and includes a wiring member 200 having a plurality of wiring layers 201, 204, and 207 between the first surface 200A and the second surface 200B, and a carrier 300 bonded to the first surface 200A via an adhesive 400 and having a plurality of layers 301 to 303 of different thermal expansion coefficients. The pitch of the wires included in the plurality of wiring layers 201, 204, and 207 is smaller on the second surface 200B side than on the first surface 200A side. The direction in which the wiring member 200 warps when heated and the direction in which the carrier 300 warps are opposite to each other.SELECTED DRAWING: Figure 5
【課題】半導体チップを実装する際の反りを抑制することができる配線基板、配線基板の製造方法及び半導体パッケージの製造方法を提供する。【解決手段】配線基板1は、第1の面200A及び第2の面200Bを備え、第1の面200Aと第2の面200Bとの間に複数の配線層201、204、207を有する配線部材200と、接着剤400を介して第1の面200Aに接着され、互いに熱膨張係数が異なる複数の層301〜303を有するキャリア300と、を有する。複数の配線層201、204、207に含まれる配線のピッチは、第1の面200A側よりも第2の面200B側で狭くなっている。加熱されたときに配線部材200が反ろうとする方向とキャリア300が反ろうとする方向とが逆向きである。【選択図】図5 |
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Bibliography: | Application Number: JP20180109772 |