SPECIMEN MEASUREMENT SYSTEM AND RACK CONVEYANCE METHOD

• Main Authors: WAKAMIYA YUJI, MASUTANI KOICHI
• Format: Patent
• Language: English; Japanese
• Published: 10.10.2019
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

To provide a specimen measurement system with which it is possible to collectively supply consumables to a plurality of specimen measurement units, and a rack conveyance method for supplying a rack accommodating a plurality of consumables to the plurality of specimen measurement units.SOLUTION: The specimen measurement system comprises: a plurality of specimen measurement units 1a, 1b for measuring a specimen using consumables; a consumables rack installation section 21 where a consumables rack is installed; a first conveyance path F for supplying a consumables rack installed in the consumables rack installation section 21 to each of the plurality of specimen measurement units 1a, 1b; a consumables rack collection section 22 in which empty racks having been emptied via at least one of the plurality of specimen measurement units 1a, 1b are collected; and a second conveyance path R for conveying an empty rack to the consumables rack collection section 22.SELECTED DRAWING: Figure 4A 【課題】複数の検体測定ユニットへの消耗品の供給を一括して行うことができる検体測定システム、および複数の消耗品を収容しているラックを複数の検体測定ユニットに供給するラックの搬送方法を提供する。【解決手段】検体測定システムは、消耗品を用いて検体の測定を行う複数の検体測定ユニット１ａ、１ｂと、消耗品ラックが設置される消耗品ラック設置部２１と、消耗品ラック設置部２１に設置された消耗品ラックを複数の検体測定ユニット１ａ、１ｂのそれぞれに供給する第１搬送路Ｆと、複数の検体測定ユニット１ａ、１ｂの少なくとも１つを経由して空になった空ラックを回収する消耗品ラック回収部２２と、空ラックを消耗品ラック回収部２２に搬送する第２搬送路Ｒと、を備える。【選択図】図４Ａ