IMAGING APPARATUS
To provide an imaging apparatus which is reduced in noise and has a wide dynamic range.SOLUTION: The imaging apparatus includes a semiconductor substrate 120, a first photoelectric conversion part which is arranged in the semiconductor substrate 120, a second photoelectric conversion part which is a...
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Main Authors | , , , |
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Format | Patent |
Language | English Japanese |
Published |
26.09.2019
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Subjects | |
Online Access | Get full text |
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Summary: | To provide an imaging apparatus which is reduced in noise and has a wide dynamic range.SOLUTION: The imaging apparatus includes a semiconductor substrate 120, a first photoelectric conversion part which is arranged in the semiconductor substrate 120, a second photoelectric conversion part which is arranged in the semiconductor substrate 120 and different from the first photoelectric conversion part, a wiring layer which is arranged above the semiconductor substrate 120, and a capacitive element 110 which is arranged in the wiring layer and surrounds the first photoelectric conversion part in a plan view. The capacitive element 110 includes a lower electrode 111 as an example of a first electrode, an upper electrode 112 as an example of a second electrode, and a dielectric layer 113 which is arranged between the first electrode and the second electrode. The first electrode is connected to a photodiode 410 as an example of the first photoelectric conversion part or the second photoelectric conversion part.SELECTED DRAWING: Figure 5
【課題】低ノイズで、かつ、広ダイナミックレンジの撮像装置を提供する。【解決手段】本開示の一態様に係る撮像装置は、半導体基板120と、半導体基板120内に配置された第1の光電変換部と、半導体基板120内に配置された第1の光電変換部とは異なる第2の光電変換部と、半導体基板120の上方に配置された配線層と、配線層内に配置され、平面視において、第1の光電変換部を囲む容量素子110と、を備える。容量素子110は、第1の電極の一例である下部電極111、第2の電極の一例である上部電極112、及び第1の電極と第2の電極との間に配置された誘電体層113を含む。第1の電極は、第1の光電変換部又は第2の光電変換部の一例であるフォトダイオード410に接続されている。【選択図】図5 |
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Bibliography: | Application Number: JP20190034996 |