ANALYZER
To control temperature of a sample vaporization chamber more accurately.SOLUTION: An analyzer comprises: a sample vaporization chamber where, in a case where a sample is a liquid sample, the injected liquid sample is vaporized; a first temperature adjustment unit and a second temperature adjustment...
Saved in:
Main Authors | , |
---|---|
Format | Patent |
Language | English Japanese |
Published |
08.08.2019
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | To control temperature of a sample vaporization chamber more accurately.SOLUTION: An analyzer comprises: a sample vaporization chamber where, in a case where a sample is a liquid sample, the injected liquid sample is vaporized; a first temperature adjustment unit and a second temperature adjustment unit that adjust temperature of a sample vaporization chamber; a separation column coupled to the sample vaporization chamber and separating a gaseous sample; and a detection unit that detects a sample separated by the separation column.SELECTED DRAWING: Figure 2
【課題】試料気化室の温度をより精密に制御する。【解決手段】分析装置は、試料が注入され、試料が液体試料の場合には注入された液体試料を気化する試料気化室と、試料気化室の温度を調節する第1温度調節部および第2温度調節部と、試料気化室と接続され、気体状態の試料を分離する分離カラムと、分離カラムで分離された試料を検出する検出部とを備える。【選択図】図2 |
---|---|
Bibliography: | Application Number: JP20180013051 |