METHOD OF SELECTIVE DEPOSITION TO FORM FULLY SELF-ALIGNED VIA

To provide a method for selective membrane deposition.SOLUTION: A method includes a step of providing a substrate 1 including a metal layer 104 having a dielectric materials 100 and 101 and a metal oxide layer 107 thereon, a step of coating the substrate with a metal-containing catalyst layer 105, a...

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Bibliographic Details
Main Author KANDABARA N TAPILY
Format Patent
LanguageEnglish
Japanese
Published 20.06.2019
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Summary:To provide a method for selective membrane deposition.SOLUTION: A method includes a step of providing a substrate 1 including a metal layer 104 having a dielectric materials 100 and 101 and a metal oxide layer 107 thereon, a step of coating the substrate with a metal-containing catalyst layer 105, a step of treating the substrate with an alcohol solution that removes the metal oxide layer from the metal layer with the metal-containing catalyst layer on the metal oxide layer, and a step of exposing the substrate to a process gas including a silanol gas for selectively depositing a SiOfilm on the metal-containing catalyst layer on the dielectric material over a period of time.SELECTED DRAWING: Figure 1B 【課題】選択的膜付着のための方法を提供する。【解決手段】方法は、誘電体材料100、101及びその上に酸化金属層107を有する金属層104を含む基板1を提供するステップと、基板を金属含有触媒層105で被覆するステップと、酸化金属層上の金属含有触媒層と共に金属層から酸化金属層を除去するアルコール溶液で基板を処理するステップと、誘電体材料上の金属含有触媒層上にSiO2膜を選択的に付着させるシラノールガスを含むプロセスガスに基板をある期間にわたって暴露するステップと、を含む。【選択図】図1B
Bibliography:Application Number: JP20180216745