STRUCTURE INSPECTION DEVICE

• Main Authors: KUROKAWA SHINICHIRO, MORI SHIGENORI, MINAMIDE SHIGEKATSU
• Format: Patent
• Language: English; Japanese
• Published: 20.06.2019
• Subjects: ASSEMBLY OF BRIDGES; CHAMBERS PROVIDED WITH MANIPULATION DEVICES; CONSTRUCTION OF BRIDGES; CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES; FIXED CONSTRUCTIONS; HAND TOOLS; MANIPULATORS; OR VIADUCTS; PERFORMING OPERATIONS; PORTABLE POWER-DRIVEN TOOLS; TRANSPORTING

To provide a structure inspection device capable of performing inspection work by advancing along the surface of an inspection spot such as a narrow place smoothly.SOLUTION: A structure inspection device, as a localized area imaging mechanism, comprises: an imaging part 20 for capturing the image of an inspection spot; a guide member 30 with a tip part to which the imaging part 20 is attached and capable of being deformed so as to be along the surface of an inspection spot; an action part 40 for moving the imaging part 20 along an inspection spot while deforming the guide member 30 so as to be along the surface of the inspection spot by operating the guide member 30 so as to bring the imaging part 20 into contact with the inspection spot; and a setting part 50 for setting the operation direction of the action part 40 so as to go toward an inspection spot.SELECTED DRAWING: Figure 1 【課題】本発明は、狭隘箇所等の点検個所の表面に沿ってスムーズに進入して点検作業を行うことができる構造物点検装置を提供することを目的とするものである。【解決手段】構造物点検装置は、局部撮影機構として、点検個所を撮影する撮影部２０と、撮影部２０を先端部に取り付けるとともに点検個所の表面に沿うように変形可能な案内部材３０と、点検個所に向かって撮影部２０を当接するように案内部材３０を動作させることで案内部材３０を点検個所の表面に沿うように変形させながら撮影部２０を点検個所に沿って移動させる動作部４０と、動作部４０の動作方向を点検個所に向かうように設定する設定部５０とを備えている。【選択図】図１